SP4-Platform: Integration and management of the platform
Themes
This project is a "platform project" where a simulation and a measurement platform on microforces will be developed. This platform is open to academic and industrial partnerships.
- Theme 1: this project is a "platform project" where a simulation and a measurement platform on microforces will be developed. This platform is open to academic and industrial partnerships.
- Theme 2: the study of interfaces users and their standardization between the measurement platform and the simulation platform, as well as the definition of the access, possibilities and management of the platform..
Composition of the station
The following figure pictures the state of the station.
The NANOROL platform.
The basic platform is composed of:
- an AFM microscope,
- three linear micropositioning stages,
- computer for control and data-acquisition,
- an anti-vibration laboratory table,
- and an optical videomicroscope.
The environment is controlled using the following materials:
- a vertical laminar flow workstation,
- sensors for humidity and temperature,
- an air-conditioner,
- and a dehumidifier.
Possible configurations of the platform
The following figures picture two possible configurations of the NANOROL station.
Vertical configuration of the platform.
Horizontal configuration of the platform.
Software
The platform uses the software AP2M (Application pour le Pilotage de MicroManipulations) for the control of different modules of the station and the acquisition of measures. A special module of the acquisition for the platform give :
- parameters definition of the measurement cycles (speed, load, maxi scale),
- direct visualization of the approach-retry curve,
- acquisition and backup copy of the measured data in files.
The following figure pictures a part of the user interface to manage the platform.
User interface.
Examples of measurements
- Approach-retry curves with cantilever on different substrates (glass, teflon, polystyrene, PMMA, or, copper, water), on conducting substrates (copper, platine) on other substrates (pollen or CNT).
- Approach-retry curves with tipless cantilever on different substrates (glass ball, Gelpack, CNT, polarized copper).
- Approach-retry curves with tipless cantilever on different substrates (axxis, lexan, makrolon, PMMA, polystyrene, teflon).
- Approach-retry curves with cantilever and glass sphere on different substrates (silicon, polystyrene, glass et on actuator finger) and under different environment (air, water).
- Analysis and control of the hystereses of the AFM piezotube (identification, compensation).
- Measures with the levitation sensor.
- Measures of the pull-off force in controlled environment, according to the preload on substrates (gold, aluminum, copper, chromium, titan, Gelpak, Sifit) for stiffness varying from 0.03 [N/m] to 14 [N/m].
- Measure in liquid on bubbles.